Studying electron transfer at electrochromic tungsten oxide sol-gel films with scanning electrochemical microscopy (SECM).

Citation:

Turyan I, Orel B, Reisfeld R, Mandler D. Studying electron transfer at electrochromic tungsten oxide sol-gel films with scanning electrochemical microscopy (SECM). Phys. Chem. Chem. Phys.Physical Chemistry Chemical Physics. 2003;5 (15) :3212 - 3219.

Date Published:

2003///

Abstract:

Electron transfer processes at tungsten oxide films prepd. by the sol-gel method were investigated and characterized by scanning electrochem. microscopy (SECM) and cyclic voltammetry. The feedback mode of the SECM was used for studying the localization and mechanism of the heterogeneous charge transfer at tungsten oxide thin films, which were deposited on conducting, i.e., tin oxide, and insulating substrates. Investigating the feedback current as a function of the mediator concn., thickness of the tungsten oxide film and the nature and concn. of the electrolyte, allow detn. of the rate limiting step and cond. of the film. [on SciFinder(R)]

Notes:

CAPLUS AN 2003:544943(Journal)