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Ginsburg A, Ben-Nun T, Asor R, Shemesh A, Fink L, Tekoah R, Levartovsky Y, Khaykelson D, Dharan R, Fellig A, et al. D+: software for high-resolution hierarchical modeling of solution X-ray scattering from complex structures. Journal of Applied Crystallography [Internet].  2019;52 (1) :219-242.\par \par }